Mikhailik T.
Publicaţii peste hotare - 1, Descărcări - 0, Vizualizări - 105
ISO 690-2012
Characterization of thin film semiconductor heterostructures using interference modes in wide spectral region    |
Dmitruk Nicolas , Gorea Oleg , Mikhailik T. , Pidlisnyi E. , Romaniuk Volodymyr  , Wagner Thomas |
| Proceedings of SPIE - The International Society for Optical Engineering |
| Vol.5024. 2003. Bellingham, Washington. SPIE. 223-228. |
| Disponibil online 30 January, 2024. Descarcări-0. Vizualizări-105 |
