The morphology and microstructure of silicophosphate films, undoped and doped by neodymium, were considered in the work. Strength characteristics (Young modulus and hardness) both the SiO2P2O5-Nd2O3 and SiO2-P2O5 films under Pmax=10 mN were also studied. In addition to that, the investigation of the soda-lime glass (SLG) substrate and as a whole of the composite structures SiO2-P2O5-Nd2O3/SLG and SiO2-P2O5/SLG (Рmax=10, 100 and 900 mN) was carried out. A specific microstructure, composed of basic film on which the structural units of small dimensions, about 0.1-0.2 μm, quasi-uniformly distributed, together with roundly structural units from some to tens micrometers, was detected on the SiO2-P2O5-Nd2O3 and SiO2-P2O5 film surfaces. (Fig.1).figureFig.1. Surface microstructure of the SiO2-P2O5-Nd2O3 film deposited on surface of sodalime glass (SLG)The film surface morphology and microstructure exhibited a high time-stability as a result of the long-term rest (3 years). It is determined, both the films and composite structures possess the strength properties of high quality (Table 1). Table. 1. Values of Young modulus (E) and hardness (H) of composite structures SiO2-P2O5-Nd2O3/SLG, SiO2-P2O5/SLG and substrate SLGtabelThe SiO2-P2O5 films demonstrated quite good adhesive behavior. At the same time less cohesion strength ’film-substrate’ was revealed for the composite structure SiO2-P2O5-Nd2O3/SLG. A further research will be directed at the improvement of the adhesive behavior of structure under study.