| Articolul precedent |
| Articolul urmator |
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 319 2 |
| Ultima descărcare din IBN: 2024-04-22 12:00 |
| Căutarea după subiecte similare conform CZU |
| 621.315.592 (96) |
| Electrotehnică (1154) |
 SM ISO690:2012ГУК, Максим. Модернизация установки для измерения зависимости электрических свойств полупроводниковых материалов от температуры. In: ICT plus : “Information and Communication Technologies – 2009”, Ed. 1, 18-21 mai 2009, Chisinau. Chişinău: Tipogr. «Elan Poligraf» SRL, 2009, Ediția 1, pp. 102-105. ISBN 978-9975-66-134-8. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| ICT plus Ediția 1, 2009 |
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Conferința "ICT plus" 1, Chisinau, Moldova, 18-21 mai 2009 | ||||||
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| CZU: 621.315.592 | ||||||
| Pag. 102-105 | ||||||
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 Descarcă PDF |
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| Rezumat | ||||||
The problem of modernization of obsolete installations, which are used in different science measurements, is very actual in our country. Modernization means supplement of additional modules in installations for their conjunction with computer. Present work deals with modernization of installation for measurements of temperature dependencies of electrical properties of semiconductor materials. In this paper are considered some modules, which were added to installation, and software for usage of this installation and added modules. |
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| Cuvinte-cheie modernization, Installation, additional modules, Semiconductor materials, software. |
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