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| Ultima descărcare din IBN: 2021-08-09 23:34 |
| Căutarea după subiecte similare conform CZU |
| 621.382.019.39:539.1.043 (1) |
| Electrotehnică (1154) |
| Fizică nucleară. Fizică atomică. Fizică moleculară (87) |
 SM ISO690:2012RUSANOVSCHI, Vitalie. Determinarea nivelului de stabilitate a elementelor logice la acţiunea iradierii ionizante. In: Intellectus, 2003, nr. 1, pp. 72-74. ISSN 1810-7079. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| Intellectus | ||||||
| Numărul 1 / 2003 / ISSN 1810-7079 /ISSNe 1810-7087 | ||||||
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| CZU: 621.382.019.39:539.1.043 | ||||||
| Pag. 72-74 | ||||||
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| Rezumat | ||||||
T he most important point in researching the Integrated Circuits that are under the ionized
irradiation influence, is to determine the level of stability under the irradiation. It is proposed a
method in order to determine the level of stability based on the results of the dynamic characteristics
simulation of the Integrated Circuits logical elements using the modeling program SPICE. The main
factor which allows to determine the level of stability is to find out correctly the parameter or the set of
parameters with the help of which it is determined the level of stability under the irradiation. |
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