Afișare rezultate |    SM ISO690:2012 |
Afisarea articolelor 1-2(2) pentru cuvîntul-cheie "Deep level transient spectroscopy (DLTS)"
| Investigation of traps in InP:Zn single crystals implanted by phosphorus ions |
| Rădăuţanu Sergiu, Tighineanu Ion, Ursachi Veaceslav, Pyshnaya N. |
| Institute of Applied Physics, Academy of Sciences of Moldova |
| Physica Status Solidi (A) Applied Research |
| Nr. / 1989 / ISSN 0031-8965 /ISSNe 1521-396X |
| Disponibil online 2 February, 2024. Descarcări-0. Vizualizări-63 |
| Some complications of the DLTS technique caused by non-exponential relaxation of barrier capacitance |
| Ivashchenko Anatolii, Kopanskaya F., Solomonov A., Tarcenco Victor |
| Institute of Applied Physics, Academy of Sciences of Moldova |
| Semiconductor Science and Technology |
| Nr. / 1993 / ISSN 0268-1242 |
| Disponibil online 31 August, 2023. Descarcări-0. Vizualizări-125 |
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