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Prezenţa autorilor din străinătate în revista Materials Research Express

Afisarea articolelor: 1-2(2)
2019
1. OKUMUŞ, E., Gebze Technical University, Turcia, OZTURK, S., Gebze Technical University, Turcia, CHUMAKOV, Y., dr., NADJAFOV, A., MAMEDOV, N., Institute of Physics, Azerbaijan National Academy of Sciences, Azerbaijan, MAMMADOV, T., Institute of Physics, Azerbaijan National Academy of Sciences, Azerbaijan, WAKITA, K., Chiba Institute of Technology, Japonia, SHIM, Y., Osaka Prefecture University, Japonia, MIKAILZADE, F., Gebze Technical University, Turcia, SEYIDOV, M., Gebze Technical University, Turcia Identification of Mn dopant in the structure of TlInS 2 layered semiconductor. Materials Research Express. 2019, nr. 5(6), 0-0. ISSN - ISSNe 2053-1591.
2. POTLOG, T., dr., GHIMPU, L., dr., SUMAN, V., PANTAZI, A., Universitatea Politehnică din Bucureşti, România, ENACHESCU, M., Academia Româna, România Influence of RF sputtering power and thickness on structural and optical properties of NiO thin films. Materials Research Express. 2019, nr. 6(9), 0-0. ISSN - ISSNe 2053-1591.
 
 

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