Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
Close
Conţinutul numărului revistei
Articolul precedent
Articolul urmator
546 2
Ultima descărcare din IBN:
2023-10-23 14:36
SM ISO690:2012
POPA, Mihail, TIGINYANU, Ion, URSACHI, Veaceslav. Optical constants of ZnSxSe1–x thin films calculated from transmission spectra. In: Moldavian Journal of the Physical Sciences, 2017, nr. 1-2(16), pp. 78-93. ISSN 1810-648X.
EXPORT metadate:
Google Scholar
Crossref
CERIF

DataCite
Dublin Core
Moldavian Journal of the Physical Sciences
Numărul 1-2(16) / 2017 / ISSN 1810-648X /ISSNe 2537-6365

Optical constants of ZnSxSe1–x thin films calculated from transmission spectra


Pag. 78-93

Popa Mihail1, Tiginyanu Ion2, Ursachi Veaceslav2
 
1 "Alecu Russo" State University of Balti,
2 Institute of the Electronic Engineering and Nanotechnologies "D. Ghitu" of the Academy of Sciences of Moldova
 
 
Disponibil în IBN: 7 februarie 2019


Rezumat

We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determined: refractive index n(l),extinction coefficient k(l), the E0 parameter, dispersion parameter Ed, oscillator strength S0, real e1(l) and imaginary e2(l) parts of the dielectric constant, high-frequency dielectric constant e∞, and ratio N/m*. The obtained data are in good agreement with the data for bulk ZnSe and ZnS crystals.