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<creators>
<creator>
<creatorName>Sineavschii, E.P.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Karapetyan, S.A.</creatorName>
<affiliation>Universitatea din Tiraspol „T.G. Şevcenko” , Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Costiuchevici, N.S.</creatorName>
<affiliation>Universitatea din Tiraspol „T.G. Şevcenko” , Moldova, Republica</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='ru'>Теория рассеяния носителей на шероховатой поверхности в квантовых проволоках</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2018</publicationYear>
<relatedIdentifier relatedIdentifierType='ISBN' relationType='IsPartOf'>978-9975-45-540-4</relatedIdentifier>
<subjects>
<subject>Quantum wire</subject>
<subject>carrier scattering</subject>
<subject>roughness surface</subject>
</subjects>
<dates>
<date dateType='Issued'>2018</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Conference Paper</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'><p>We theoretically investigated various models of interaction processes with a rough surface in quantum wires. We received an analytical solution for the carrier relaxation time in quantum wires under various conditions. The graphs of the dependence of the parameters of interaction with a rough surface on the values of the electric field are shown.</p></description>
</descriptions>
<formats>
<format>application/pdf</format>
</formats>
</resource>