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 SM ISO690:2012BĂJENESCU, Titu-Marius. Electrical Noise and Semiconductor Reliability. In: EEA - Electrotehnica, Electronica, Automatica, 2023, vol. 71, pp. 51-58. ISSN -. DOI: https://doi.org/10.46904/eea.23.71.4.1108006 |
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 EEA - Electrotehnica, Electronica, Automatica |
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| Volumul 71 / 2023 / ISSN - /ISSNe 1582-5175 | ||||||
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| DOI:https://doi.org/10.46904/eea.23.71.4.1108006 | ||||||
| Pag. 51-58 | ||||||
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Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices. |
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| Cuvinte-cheie bias, electrical noise, experimental, filament, holes, lifepath, Magnetic, magnetic field, noise, noise voltage, recombination, Semiconductors, side arms, Single crystal, surface, system technical, transit time |
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