Articolul precedent |
Articolul urmator |
99 0 |
SM ISO690:2012 PERJU, Veacheslav, CASASENT, David P., PERJU, Veacheslav, ZAVROTSCHI, Serghei. Optical-electronic moments features-based recognition system controlled by parameters of the input images. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 14, 24-25 aprilie 2003, Orlando, Florida. Bellingham, Washington: SPIE, 2003, Ediţia 14, Vol.5106, pp. 241-248. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.501412 |
EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
Proceedings of SPIE - The International Society for Optical Engineering Ediţia 14, Vol.5106, 2003 |
||||||
Conferința "Optical Pattern Recognition" 14, Orlando, Florida, Statele Unite ale Americii, 24-25 aprilie 2003 | ||||||
|
||||||
DOI:https://doi.org/10.1117/12.501412 | ||||||
Pag. 241-248 | ||||||
|
||||||
Descarcă PDF | ||||||
Rezumat | ||||||
The new methods of invariant pattern recognition (IPR), based on the effective calculation of image moment features are presented. It is described the special purpose multiprocessor computer system, which realizes the proposed methods of IPR. The system is reconfigurable, with the architecture controlled by parameters of the input images. |
||||||
Cuvinte-cheie computer system, image, Moment features, Recognition |
||||||
|
Crossref XML Export
<?xml version='1.0' encoding='utf-8'?> <doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'> <head> <doi_batch_id>ibn-196184</doi_batch_id> <timestamp>1715405906</timestamp> <depositor> <depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name> <email_address>idsi@asm.md</email_address> </depositor> </head> <body> <collection> <collection_metadata> <full_title>Proceedings of SPIE - The International Society for Optical Engineering</full_title> <issn media_type='print'>0277-786X</issn> </collection_metadata> <collection_issue> <publication_date media_type='print'> <year>2003</year> </publication_date> </collection_issue> <collection_article publication_type='full_text'><titles> <title>Optical-electronic moments features-based recognition system controlled by parameters of the input images</title> </titles> <contributors> <person_name sequence='first' contributor_role='author'> <given_name>Veaceslav</given_name> <surname>Perju</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>David P.</given_name> <surname>Casasent</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>Veacheslav</given_name> <surname>Perju</surname> </person_name> <person_name sequence='additional' contributor_role='author'> <given_name>Serghei</given_name> <surname>Zavrotschi</surname> </person_name> </contributors> <publication_date media_type='print'> <year>2003</year> </publication_date> <pages> <first_page>241</first_page> <last_page>248</last_page> </pages> <doi_data> <doi>10.1117/12.501412</doi> <resource>http://www.crossref.org/</resource> </doi_data> </collection_article> </collection> </body> </doi_batch>