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 SM ISO690:2012NASTAS, Vitalie. Precision measurement of impedance components by method of simulated resonance. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 1, 3-7 mai 2004, Chisinau. Bellingham, Washington: SPIE, 2005, Vol.5822, pp. 184-191. ISBN 0819458074. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.612041 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
 Proceedings of SPIE - The International Society for Optical Engineering Vol.5822, 2005 |
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Conferința "Information Technologies 2004" 1, Chisinau, Moldova, 3-7 mai 2004 | ||||||
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| DOI:https://doi.org/10.1117/12.612041 | ||||||
| Pag. 184-191 | ||||||
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In paper the modern practical implementation of a resonance method suitable for application in the precision devices for impedance components measurement is submitted. The method of measurement and its practical implementation in the series and parallel resonance circuits is analyzed. As reference element the impedance simulator is applied, for which the analysis of a basic error is carried out. For reproduction of the impedances represented in different coordinate sistems are offered the impedance simulator with ladder structure and the impedance simulator with separate regulation of the module and phase, the analysis of their conversion functions and practical applications is carried out. The structure of polar -coordinate impedance meter is offered and the algorithm of its equilibration is analyzed. |
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| Cuvinte-cheie impedance components, impedance simulator, Resonance circuits, simulated resonance |
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