| Articolul precedent |
| Articolul urmator |
 |
 127 0 |
 SM ISO690:2012POTLOG, Tamara, SITES, James R., GASHIN, Peter A., GHIMPU, Lidia. Thickness dependent properties of CdS/CdTe hetero-photo-elements. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 25, 8-12 octombrie 2002, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 2002, Vol. 1, Ediția 25, pp. 223-226. ISBN 0780374401. DOI: https://doi.org/10.1109/SMICND.2002.1105836 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
 Proceedings of the International Semiconductor Conference Vol. 1, Ediția 25, 2002 |
||||||
|
Conferința "25th International Semiconductor Conference" 25, Sinaia, Romania, 8-12 octombrie 2002 | ||||||
|
||||||
| DOI:https://doi.org/10.1109/SMICND.2002.1105836 | ||||||
| Pag. 223-226 | ||||||
|
||||||
 Descarcă PDF |
||||||
| Rezumat | ||||||
The analysis of the I-V characteristics of CdS/CdTe heterojunction shows the strong influence of the time of deposition of CdTe on the photo-electrical parameters. The best parameters with no antireflection coating: Jsc = 24,8 mA/cm2, Voc = 0,82V, FF = 0,48, η = 9,76% are obtained in the case when time of deposition of CdTe is 3,5min. The photoresponse decreases with increasing of the CdTe thickness. The photosensitivity covers the wavelength range from 0,50 μm to 0,86 μm for all cells. The most efficient carrier generation and collection is for the structure with the time of the CdTe layer deposition of 3,5 min. |
||||||
| Cuvinte-cheie Antireflection coatings, Cadmium Sulfide, Cadmium Telluride, charge carriers, deposition, Heterojunctions |
||||||
|
Google Scholar Export
<meta name="citation_title" content="Thickness dependent properties of CdS/CdTe hetero-photo-elements"> <meta name="citation_author" content="Potlog Tamara"> <meta name="citation_author" content="Sites James R."> <meta name="citation_author" content="Gashin Peter A."> <meta name="citation_author" content="Ghimpu Lidia"> <meta name="citation_publication_date" content="2002"> <meta name="citation_collection_title" content="Proceedings of the International Semiconductor Conference"> <meta name="citation_volume" content="Vol. 1, Ediția 25"> <meta name="citation_firstpage" content="223"> <meta name="citation_lastpage" content="226"> <meta name="citation_pdf_url" content="https://ibn.idsi.md/sites/default/files/imag_file/thickness-dependent-properties-of-cdscdte-heterophotoelements.pdf">
|
|
|
