Articolul precedent |
Articolul urmator |
420 0 |
SM ISO690:2012 MORARI, Vadim, RUSU, Emil, URSACHI, Veaceslav, NIELSCH, Kornelius, TIGINYANU, Ion. Aerosol Spray Deposited Wurtzite ZnMgO Alloy Films with MgO Nanocrystalline Inclusions. In: IFMBE Proceedings: . 5th International Conference on Nanotechnologies and Biomedical Engineering, Ed. 5, 3-5 noiembrie 2021, Chişinău. Chişinău: Pontos, 2022, Ediția 5, Vol.87, pp. 32-39. ISSN 16800737. DOI: https://doi.org/10.1007/978-3-030-92328-0_5 |
EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
IFMBE Proceedings Ediția 5, Vol.87, 2022 |
|
Conferința "Conference on Nanotechnologies and Biomedical Engineering" 5, Chişinău, Moldova, 3-5 noiembrie 2021 | |
|
|
DOI:https://doi.org/10.1007/978-3-030-92328-0_5 | |
Pag. 32-39 | |
Vezi articolul | |
Rezumat | |
In this paper Zn1-xMgxO thin films with composition range x = 0.00–0.80 have been obtained by aerosol spray deposition method on p-Si substrates by using zinc acetate and magnesium acetate as precursors. The produced thin films were characterized by scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, X-ray diffraction (XRD), and optical spectroscopy. SEM images revealed uniform nanocrystalline morphology of films, but the form of nanocrystals vary with variation of the Mg content. XRD analysis suggests that the produced films contain a wurtzite Zn1-xMgxO phase in the whole chemical composition range, with cubic phase MgO nanocrystalline inclusions with mean grain size around 20 nm. The optical bandgap was found to vary from 3.4 eV to 5.2 eV with increasing the Mg content from 0 to 60%. |
|
Cuvinte-cheie band gap, SEM, thin films, X-ray diffraction, Zn1-xMgxO |
|
|
DataCite XML Export
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'> <creators> <creator> <creatorName>Morari, V.A.</creatorName> <affiliation>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu", Moldova, Republica</affiliation> </creator> <creator> <creatorName>Rusu, E.V.</creatorName> <affiliation>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu", Moldova, Republica</affiliation> </creator> <creator> <creatorName>Ursachi, V.V.</creatorName> <affiliation>Universitatea Tehnică a Moldovei, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Nielsch, K.</creatorName> <affiliation>Leibniz Institute for Solid State and Materials Reseach, Dresden, Germania</affiliation> </creator> <creator> <creatorName>Tighineanu, I.M.</creatorName> <affiliation>National Center for Materials Study and Testing, Technical University of Moldova, Moldova, Republica</affiliation> </creator> </creators> <titles> <title xml:lang='en'>Aerosol Spray Deposited Wurtzite ZnMgO Alloy Films with MgO Nanocrystalline Inclusions</title> </titles> <publisher>Instrumentul Bibliometric National</publisher> <publicationYear>2022</publicationYear> <relatedIdentifier relatedIdentifierType='ISBN' relationType='IsPartOf'></relatedIdentifier> <subjects> <subject>band gap</subject> <subject>SEM</subject> <subject>thin films</subject> <subject>X-ray diffraction</subject> <subject>Zn1-xMgxO</subject> </subjects> <dates> <date dateType='Issued'>2022</date> </dates> <resourceType resourceTypeGeneral='Text'>Conference Paper</resourceType> <descriptions> <description xml:lang='en' descriptionType='Abstract'><p>In this paper Zn<sub>1-x</sub>Mg<sub>x</sub>O thin films with composition range x = 0.00–0.80 have been obtained by aerosol spray deposition method on p-Si substrates by using zinc acetate and magnesium acetate as precursors. The produced thin films were characterized by scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, X-ray diffraction (XRD), and optical spectroscopy. SEM images revealed uniform nanocrystalline morphology of films, but the form of nanocrystals vary with variation of the Mg content. XRD analysis suggests that the produced films contain a wurtzite Zn<sub>1-x</sub>Mg<sub>x</sub>O phase in the whole chemical composition range, with cubic phase MgO nanocrystalline inclusions with mean grain size around 20 nm. The optical bandgap was found to vary from 3.4 eV to 5.2 eV with increasing the Mg content from 0 to 60%.</p></description> </descriptions> <formats> <format>uri</format> </formats> </resource>