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Afisarea articolelor 1-1(1) pentru cuvîntul-cheie "Compressive stress"
Growth and characterization of crack-free GaN films grown on cracked Si-doped GaN templates |
1, 1, Chua Soo Jin1, 23, 4, 4, 4, 5, 5 |
1 Institute of Materials Research Engineering, Singapore , 2 Institute of Applied Physics, Academy of Sciences of Moldova, 3 Technical University of Moldova, 5 National University of Singapore |
Proceedings of SPIE - The International Society for Optical Engineering |
Nr. / 2001 / ISSN 0277-786X /ISSNe 1996-756X |
Disponibil online 14 February, 2024. Descarcări-1. Vizualizări-78 |
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