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SM ISO690:2012
Afisarea articolelor 1-3(3) pentru cuvîntul-cheie "X-ray diffraction patterns"
Characterization of some optical and physical properties of As11.2S48.0Sb28.8Te12.0 and As20.8S48.0Sb19.2Te12.0 nanostructured polycrystalline semiconductors
Iaseniuc Oxana, Iovu Mihail
Institute of Applied Physics
Chalcogenide Letters
Nr. 2(19) / 2022 / ISSN 1584-8663
Disponibil online 17 March, 2022. Descarcări-0. Vizualizări-273
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Assessing the structural properties of gexasxse1-2x chalcogenide systems through cross-correlated stem, xrd and micro-raman studies
Iaseniuc Oxana1, Iovu Mihail1, Pantazi Aida Ghiulnare2, Lazăr Oana Andreea3, Moise Calin3, Enăchescu Marius34
1 Institute of Applied Physics,
2 S.C. NanoPRO START MC S.R.L., Pitesti,
3 University Politehnica of Bucharest,
4 Academy of Romanian Scientists
Optoelectronics and Advanced Materials, Rapid Communications
Nr. 9-10(15) / 2021 / ISSN 1842-6573 /ISSNe 2065-3824
Disponibil online 3 January, 2022. Descarcări-0. Vizualizări-313
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Structural Characterization of Some As-S-Sb-Te Nanostructured Materials
Iaseniuc Oxana, Iovu Mihail
Institute of Applied Physics
IFMBE Proceedings
Ediția 5, Vol.87. 2022. Chişinău. ISSN 16800737.
Disponibil online 30 January, 2022. Descarcări-0. Vizualizări-309
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