Afiliat la Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences
Defect formation in 6Н-SiC single crystals grown by PVT method |
Emelcenco Gennady , Johov A. , Tartakovskii I. , Maksimov A. , Aronin A. , Yakimov E. , Steinman E |
Materials Science and Condensed Matter Physics |
Editia 7. 2014. Chișinău, Republica Moldova. Institutul de Fizică Aplicată. 84-84. |
Disponibil online 26 February, 2019 |
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