Photoluminescence of hydrogenated nanocrystalline silicon films
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EMELYANOV, Andrey, KAZANSKII, Andrey, FORSH, Pavel, ZHIGUNOV, Denis, KHENKIN, Mark, KASHKAROV, P.. Photoluminescence of hydrogenated nanocrystalline silicon films. In: Microelectronics and Computer Science: The 5th International Conference, Ed. 8, 22-25 octombrie 2014, Chisinau. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2014, Ediția 8, pp. 75-77. ISBN 978-9975-45-329-5..
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Microelectronics and Computer Science
Ediția 8, 2014
Conferința "Microelectronics and Computer Science"
8, Chisinau, Moldova, 22-25 octombrie 2014

Photoluminescence of hydrogenated nanocrystalline silicon films


Pag. 75-77

Emelyanov Andrey1, Kazanskii Andrey2, Forsh Pavel12, Zhigunov Denis2, Khenkin Mark2, Kashkarov P.123
 
1 National Research Centre "Kurchatov Institute", Moscow,
2 Lomonosov Moscow State University,
3 Moscow Institute of Physics and Technology
 
 
Disponibil în IBN: 11 aprilie 2019


Rezumat

We have studied structural, electrical and photoluminescence properties of hydrogenated nanocrystalline silicon films with different crystalline volume fractions (from 0 – pristine amorphous silicon – to 55 %). The photoluminescence spectra of the films exhibit distinct features related to recombination in amorphous silicon (peak energy of about 1.35 eV) and in silicon nanocrystals (peak near 1.52 eV). When the crystalline volume fraction reached 55%, photoluminescence disappeared. Photoluminescence spectroscopy was proposed as a nondestructive method for determining of a small volume fraction of Si nanocrystals embedded in amorphous silicon.

Cuvinte-cheie
Si nanocrystals, amorphous hydrogenated silicon, photoluminescence, percolation