Oscillations of the critical temperature in superconducting Nb/Ni bilayers
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SIDORENKO, Anatolie, ZDRAVKOV, Vladimir, PREPELITSA, Andrei, HELBIG, Christoph, LUO, Yuansu, GSELL, Stefan, SCHRECK, Matthias, KLIMM, S., HÖRN, Siegfried, TAGIROV, Lenar, TIDECKS, Reinhard. Oscillations of the critical temperature in superconducting Nb/Ni bilayers. In: Annalen der Physik, 2003, vol. 12, pp. 37-50. ISSN 0003-3804. DOI: https://doi.org/10.1002/andp.200310005
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Annalen der Physik
Volumul 12 / 2003 / ISSN 0003-3804 /ISSNe 1521-3889

Oscillations of the critical temperature in superconducting Nb/Ni bilayers

DOI:https://doi.org/10.1002/andp.200310005

Pag. 37-50

Sidorenko Anatolie12, Zdravkov Vladimir2, Prepelitsa Andrei2, Helbig Christoph3, Luo Yuansu4, Gsell Stefan1, Schreck Matthias3, Klimm S.3, Hörn Siegfried3, Tagirov Lenar35, Tidecks Reinhard3
 
1 University of Augsburg,
2 Institute of Applied Physics, Academy of Sciences of Moldova,
3 Institut für Physik, Universität Augsburg,
4 Physikalisches Institut,Georg-August-Universität Göttingen,
5 Kazan Federal University
 
 
Disponibil în IBN: 28 februarie 2024


Rezumat

We investigated Nb/Ni bilayers prepared by magnetron sputtering on glass substrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by the Rutherford backscattering spectrometry (RBS). For specimens with constant Nb layer thickness we observed distinct oscillations of the superconducting critical temperature upon increasing the thickness of the Ni layer. The results are interpreted in terms of Fulde-Ferrell-Larkin-Ovchinnikov (FFLO) like inhomogeneous superconducting pairing in the ferromagnetic Ni Layer.

Cuvinte-cheie
Ferromagnetic materials, magnetron sputtering, Molecular beam epitaxy, nickel, Niobium, Rutherford backscattering spectroscopy, Superconducting films, Thickness measurement, X ray diffraction analysis

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