Chalcogenide glass thin films: Z-Scan measurements of refractive index changes

Michelotti Francesco; Bertolotti Mario; Chumash Valentin; Andriesh Andrei

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MICHELOTTI, Francesco, BERTOLOTTI, Mario, CHUMASH, Valentin, ANDRIESH, Andrei. Chalcogenide glass thin films: Z-Scan measurements of refractive index changes. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 1, 22-24 iulie 1992, San Diego, California. Bellingham, Washington: SPIE, 1993, Vol.1773, pp. 423-432. ISBN 0819409464. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.983231

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Proceedings of SPIE - The International Society for Optical Engineering
Vol.1773, 1993

Congresul "Photonics for Computers, Neural Networks, and Memories"
1, San Diego, California, Statele Unite ale Americii, 22-24 iulie 1992

Chalcogenide glass thin films: Z-Scan measurements of refractive index changes

DOI:https://doi.org/10.1117/12.983231

Pag. 423-432

Michelotti Francesco¹, Bertolotti Mario¹, Chumash Valentin², Andriesh Andrei²

¹ Sapienza University of Rome,
² Institute of Applied Physics, Academy of Sciences of Moldova

Disponibil în IBN: 12 februarie 2024

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Rezumat

Nonlinear properties of chacolgenide glass AS₂S₃ thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.

Cuvinte-cheie
Engineering controlled terms Computer networks, glass, Thin films Engineering uncontrolled terms Chalcogenide glass, Dynamical effects, Nonlinear properties, Refractive index changes, Self diffraction, Z-scan measurement Engineering main heading Refractive index