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 SM ISO690:2012ANIKIN, Valerii I., ZHURMINSKY, Igor. Kinetics of image formation in the equipotential semiconductor- thermoplastic system. In: Journal of Applied Physics, 2005, vol. 97, pp. 1-6. ISSN 0021-8979. DOI: https://doi.org/10.1063/1.1829146 |
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  Journal of Applied Physics |
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| Volumul 97 / 2005 / ISSN 0021-8979 /ISSNe 1089-7550 | ||||||
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| DOI:https://doi.org/10.1063/1.1829146 | ||||||
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The redistribution of corona current in regions with a low potential has been experimentally shown. This led to the equipotentiality of the semiconductor-thermoplastic system at charging in the field of corona discharge. The self-coordinated model of kinetics formation of electrostatic contrast in a corona discharge is proposed. The model takes into consideration a nonlinearity of current-voltage characteristics of the semiconductor, and thermoplastic and deformation of the thermoplastic layer. The moment of deformation appearance is set at random from experimental data. © 2005 American Institute of Physics. |
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| Cuvinte-cheie Engineering controlled terms Current voltage characteristics, deformation, Electric corona, Electrostatics, Holographic interferometry, Image quality, photosensitivity, Semiconductor materials, Thermoplastics, Viscoelasticity Engineering uncontrolled terms Electrostatic contrast, Photothermoplastic medium (PTPM), Semiconductor-thermoplastic systems Engineering main heading Multilayers |
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Dublin Core Export
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'> <dc:creator>Anikin, V.</dc:creator> <dc:creator>Jurmînschi, I.</dc:creator> <dc:date>2005-01-01</dc:date> <dc:description xml:lang='en'><p>The redistribution of corona current in regions with a low potential has been experimentally shown. This led to the equipotentiality of the semiconductor-thermoplastic system at charging in the field of corona discharge. The self-coordinated model of kinetics formation of electrostatic contrast in a corona discharge is proposed. The model takes into consideration a nonlinearity of current-voltage characteristics of the semiconductor, and thermoplastic and deformation of the thermoplastic layer. The moment of deformation appearance is set at random from experimental data. © 2005 American Institute of Physics.</p></dc:description> <dc:identifier>10.1063/1.1829146</dc:identifier> <dc:source>Journal of Applied Physics () 1-6</dc:source> <dc:subject>Engineering controlled terms Current voltage characteristics</dc:subject> <dc:subject>deformation</dc:subject> <dc:subject>Electric corona</dc:subject> <dc:subject>Electrostatics</dc:subject> <dc:subject>Holographic interferometry</dc:subject> <dc:subject>Image quality</dc:subject> <dc:subject>photosensitivity</dc:subject> <dc:subject>Semiconductor materials</dc:subject> <dc:subject>Thermoplastics</dc:subject> <dc:subject>Viscoelasticity Engineering uncontrolled terms Electrostatic contrast</dc:subject> <dc:subject>Photothermoplastic medium (PTPM)</dc:subject> <dc:subject>Semiconductor-thermoplastic systems Engineering main heading Multilayers</dc:subject> <dc:title>Kinetics of image formation in the equipotential semiconductor- thermoplastic system</dc:title> <dc:type>info:eu-repo/semantics/article</dc:type> </oai_dc:dc>
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