Interfacial roughness and proximity effects in superconductor/ferromagnet CuNi/Nb heterostructures
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KHAYDUKOV, Yu N., MORARI, Roman, SOLTWEDEL, Olaf, KELLER, Thomas, CHRISTIANI, Georg, LOGVENOV, Gennadii Yu., KUPRIYANOV, Mihail, SIDORENKO, Anatolie, KEIMER, Bernhard. Interfacial roughness and proximity effects in superconductor/ferromagnet CuNi/Nb heterostructures. In: Journal of Applied Physics, 2015, vol. 118, p. 0. ISSN 0021-8979. DOI: https://doi.org/10.1063/1.4936789
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Journal of Applied Physics
Volumul 118 / 2015 / ISSN 0021-8979 /ISSNe 1089-7550

Interfacial roughness and proximity effects in superconductor/ferromagnet CuNi/Nb heterostructures

DOI:https://doi.org/10.1063/1.4936789

Pag. 0-0

Khaydukov Yu N.123, Morari Roman45, Soltwedel Olaf16, Keller Thomas12, Christiani Georg1, Logvenov Gennadii Yu.1, Kupriyanov Mihail35, Sidorenko Anatolie4, Keimer Bernhard1
 
1 Max Planck Institute for Solid State Research,
2 Outstation at Heinz Maier-Leibnitz Zentrum (MLZ),
3 D.V. Skobeltsyn Institute of Nuclear Physics, M.V. Lomonosov Moscow State University,
4 Institute of the Electronic Engineering and Nanotechnologies "D. Ghitu" of the Academy of Sciences of Moldova,
5 Kazan Federal University,
6 Max Planck Society Outstation at MLZ
 
 
Disponibil în IBN: 23 mai 2023


Rezumat

We report an investigation of the structural and electronic properties of hybrid superconductor/ferromagnet (S/F) bilayers of composition Nb/Cu60Ni40 prepared by magnetron sputtering. X-ray and neutron reflectometry show that both the overall interfacial roughness and vertical correlations of the roughness of different interfaces are lower for heterostructures deposited on Al2O3(1 1 ¯ 02) substrates than for those deposited on Si(111). Mutual inductance experiments were then used to study the influence of the interfacial roughness on the superconducting transition temperature, TC. These measurements revealed a ∼4% higher TC in heterostructures deposited on Al2O3, compared to those on Si. We attribute this effect to a higher mean-free path of electrons in the S layer, caused by a suppression of diffusive scattering at the interfaces. However, the dependence of the TC on the thickness of the ferromagnetic layer is not significantly different in the two systems, indicating a weak influence of the interfacial roughness on the transparency for Cooper pairs. 

Cuvinte-cheie
aluminum, Electronic properties, inductance, Interfaces (materials), Superconducting materials

DataCite XML Export

<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'>
<identifier identifierType='DOI'>10.1063/1.4936789</identifier>
<creators>
<creator>
<creatorName>Khaydukov, Y.</creatorName>
<affiliation>Max Planck Institute for Solid State Research, Germania</affiliation>
</creator>
<creator>
<creatorName>Morari, R.A.</creatorName>
<affiliation>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Soltwedel, O.</creatorName>
<affiliation>Max Planck Institute for Solid State Research, Germania</affiliation>
</creator>
<creator>
<creatorName>Keller, T.</creatorName>
<affiliation>Max Planck Institute for Solid State Research, Germania</affiliation>
</creator>
<creator>
<creatorName>Christiani, G.</creatorName>
<affiliation>Max Planck Institute for Solid State Research, Germania</affiliation>
</creator>
<creator>
<creatorName>Logvenov, G.</creatorName>
<affiliation>Max Planck Institute for Solid State Research, Germania</affiliation>
</creator>
<creator>
<creatorName>Kupriyanov, M.I.</creatorName>
<affiliation>Нии Ядерной Физики Имени Д. В. Скобельцына, МГУ, Rusia</affiliation>
</creator>
<creator>
<creatorName>Sidorenko, A.S.</creatorName>
<affiliation>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu" al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Keimer, B.</creatorName>
<affiliation>Max Planck Institute for Solid State Research, Germania</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='en'>Interfacial roughness and proximity effects in superconductor/ferromagnet CuNi/Nb heterostructures</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2015</publicationYear>
<relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>0021-8979</relatedIdentifier>
<subjects>
<subject>aluminum</subject>
<subject>Electronic properties</subject>
<subject>inductance</subject>
<subject>Interfaces (materials)</subject>
<subject>Superconducting materials</subject>
</subjects>
<dates>
<date dateType='Issued'>2015-12-07</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'><p>We report an investigation of the structural and electronic properties of hybrid superconductor/ferromagnet (S/F) bilayers of composition Nb/Cu<sub>60</sub>Ni<sub>40</sub>&nbsp;prepared by magnetron sputtering. X-ray and neutron reflectometry show that both the overall interfacial roughness and vertical correlations of the roughness of different interfaces are lower for heterostructures deposited on Al<sub>2</sub>O<sub>3</sub>(1 1 &macr; 02) substrates than for those deposited on Si(111). Mutual inductance experiments were then used to study the influence of the interfacial roughness on the superconducting transition temperature, T<sub>C</sub>. These measurements revealed a &sim;4% higher T<sub>C</sub>&nbsp;in heterostructures deposited on Al<sub>2</sub>O<sub>3</sub>, compared to those on Si. We attribute this effect to a higher mean-free path of electrons in the S layer, caused by a suppression of diffusive scattering at the interfaces. However, the dependence of the T<sub>C</sub>&nbsp;on the thickness of the ferromagnetic layer is not significantly different in the two systems, indicating a weak influence of the interfacial roughness on the transparency for Cooper pairs.&nbsp;</p></description>
</descriptions>
<formats>
<format>uri</format>
</formats>
</resource>