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 SM ISO690:2012TEODORESCU, Horia Nicolai, COJOCARU, Victor, KATASHEV, Alexei. Multi-Criterial Assessment of the Uniformity of the Electrical Potential of Micro-Films. In: Conference on Applied Electronics, Ed. 24, 10-11 septembrie 2019, Pilsen. Pilsen: IEEE Computer Society, 2019, Ediția 24, p. 0. ISBN 978-802610813-9. ISSN 18037232. DOI: https://doi.org/10.23919/AE.2019.8867010 |
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 Conference on Applied Electronics Ediția 24, 2019 |
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Conferința "24th International Conference on Applied Electronics" 24, Pilsen, Cehia, 10-11 septembrie 2019 | |
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| DOI:https://doi.org/10.23919/AE.2019.8867010 | |
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We propose a method of characterization and assessment of the uniformity of the surface properties of samples based on a set of derived parameters. Local (sliding window) variance, Allan and Hadamard variances and centers of potential for measurement lines are used to assess the uniformity. The method is exemplified for the potential of piezoelectric thin (nano) films, but it is applicable to a large range of properties. |
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| Cuvinte-cheie Allan and Hadamard variances., correlational analysis, surface properties, uniformity assessment |
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