Afișare rezultate
Afisarea articolelor 1-1(1) pentru cuvîntul-cheie "critical radius" 
| Bend Testing of Tin Doped Bismuth Microwire |
| Dîntu Maria, Donu Sofia, Iacobciuc Dinara |
| Institute of Electronic Engineering and Industrial Technologies, Academy of Sciences of Moldova |
| Microelectronics and Computer Science |
| Ediţia 6. 2009. Bălți, Republica Moldova. ISBN 978-9975-45-045-4. |
| Disponibil online 17 July, 2023. Descarcări-0. Vizualizări-107 |
    |
1-1 of 1
