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Afisarea articolelor 1-1(1) pentru cuvîntul-cheie "X ray diffraction analysis"
Effect of substrate origin and annealing conditions on stability of electrical conductivity of SnO2 thin polycrystalline films
Ivashchenko Anatolii, Cherner Iacov, Maronchuk Irina
Institute of Applied Physics, Academy of Sciences of Moldova
Proceedings of the International Semiconductor Conference
Vol. 2. 2001. New Jersey. .
Disponibil online 29 November, 2023. Descarcări-0. Vizualizări-124
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