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Afisarea articolelor 1-1(1) pentru cuvîntul-cheie "X ray diffraction analysis" 
| Effect of substrate origin and annealing conditions on stability of electrical conductivity of SnO2 thin polycrystalline films |
| Ivashchenko Anatolii, Cherner Iacov, Maronchuk Irina |
| Institute of Applied Physics, Academy of Sciences of Moldova |
| Proceedings of the International Semiconductor Conference |
| Vol. 2. 2001. New Jersey. . |
| Disponibil online 29 November, 2023. Descarcări-0. Vizualizări-126 |
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