| Conţinutul numărului revistei |
| Articolul precedent |
| Articolul urmator |
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 SM ISO690:2012PACHECO-SANCHEZ , Anibal, BEJENARI, Igor, SCHROTER, Michael. Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs. In: IEEE Transactions on Electron Devices, 2019, nr. 11(66), pp. 4566-4571. ISSN -. DOI: https://doi.org/10.1109/TED.2019.2942783 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| IEEE Transactions on Electron Devices | ||||||
| Numărul 11(66) / 2019 / ISSN - /ISSNe 0018-9383 | ||||||
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| DOI:https://doi.org/10.1109/TED.2019.2942783 | ||||||
| Pag. 4566-4571 | ||||||
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| Rezumat | ||||||
The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port network analysis. The extracted short thermal time constant confirms the thermal stability for this emerging technology. A lumped-element electro-thermal model for multi-tube CNTFETs has been developed and proven with experimental data. |
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| Cuvinte-cheie carbon nanotube FET (CNTFET), self-heating(SH), thermal capacitance, thermal resistance |
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