Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs

Pacheco-Sanchez  Anibal; Bejenari Igor; Schroter Michael

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PACHECO-SANCHEZ , Anibal, BEJENARI, Igor, SCHROTER, Michael. Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs. In: IEEE Transactions on Electron Devices, 2019, nr. 11(66), pp. 4566-4571. ISSN -. DOI: https://doi.org/10.1109/TED.2019.2942783

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IEEE Transactions on Electron Devices

Numărul 11(66) / 2019 / ISSN - /ISSNe 0018-9383

Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs

DOI:https://doi.org/10.1109/TED.2019.2942783

Pag. 4566-4571

Pacheco-Sanchez Anibal¹, Bejenari Igor², Schroter Michael³

¹ Universitat Autònoma de Barcelona,
² Institute of the Electronic Engineering and Nanotechnologies "D. Ghitu",
³ Technische Universitat Dresden, Dresden

Disponibil în IBN: 18 noiembrie 2019

Rezumat

The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port network analysis. The extracted short thermal time constant confirms the thermal stability for this emerging technology. A lumped-element electro-thermal model for multi-tube CNTFETs has been developed and proven with experimental data.

Cuvinte-cheie
carbon nanotube FET (CNTFET), self-heating(SH), thermal capacitance, thermal resistance

DataCite XML Export

<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'>
<identifier identifierType='DOI'>10.1109/TED.2019.2942783</identifier>
<creators>
<creator>
<creatorName>Pacheco-Sanchez , A.</creatorName>
<affiliation>Universitatea Autonomă din Barcelona, Spania</affiliation>
</creator>
<creator>
<creatorName>Bejenari, I.M.</creatorName>
<affiliation>Institutul de Inginerie Electronică şi Nanotehnologii "D. Ghiţu", Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Schroter, M.</creatorName>
<affiliation>Technische Universitat Dresden, Dresden, Germania</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='en'>Self-Heating Characterization and Thermal Resistance Modeling in Multitube CNTFETs</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2019</publicationYear>
<subjects>
<subject>carbon nanotube FET (CNTFET)</subject>
<subject>self-heating(SH)</subject>
<subject>thermal capacitance</subject>
<subject>thermal resistance</subject>
</subjects>
<dates>
<date dateType='Issued'>2019-11-11</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'><p>The thermal resistance, thermal capacitance, and thermal time constant have been experimentally extracted for the first time for a multi-tube multi-finger carbon nanotube FET (CNTFET) from trap-free high-frequency characteristics by following a methodology based on temperature-dependent two-port network analysis. The extracted short thermal time constant confirms the thermal stability for this emerging technology. A lumped-element electro-thermal model for multi-tube CNTFETs has been developed and proven with experimental data.&nbsp;</p></description>
</descriptions>
<formats>
<format>uri</format>
</formats>
</resource>