Optical system test methods with photothermoplastic carrier
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PANASYUK, Lev, PSAR, Serghey. Optical system test methods with photothermoplastic carrier. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 2, 27-29 iulie 1997, San Diego, California. Bellingham, Washington: SPIE, 1997, Ediția 2, Vol.3134, pp. 148-156. ISBN 0819425567. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.295126
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Proceedings of SPIE - The International Society for Optical Engineering
Ediția 2, Vol.3134, 1997
Conferința "Optical Manufacturing and Testing II"
2, San Diego, California, Statele Unite ale Americii, 27-29 iulie 1997

Optical system test methods with photothermoplastic carrier

DOI:https://doi.org/10.1117/12.295126

Pag. 148-156

Panasyuk Lev, Psar Serghey
 
Moldova State University
 
 
Disponibil în IBN: 8 februarie 2024


Rezumat

Present paper reports the methods and the results of investigations of the optical system resolution. The limiting spatial frequencies are recorded on the photothermoplastic carriers (PTPC) in the real-time scale. The used PTPCs with a resonance frequency close to the expected boundary of the contrast-frequency response of an optical systems make it possible to record the images of different test-objects on the PTPC. This allows us to get the true data and rated values for the resolution both of the stock-produced lenses with the resolution about 300 to 500mm-1 and the special ones with the resolution above 1000mm-1.

Cuvinte-cheie
Engineering controlled terms Civil aviation, optical systems, Photolithography, Resonance Engineering uncontrolled terms Optical (PET) (OPET), Resonance frequencies, System resolution, System testing, Time scaling Engineering main heading Frequency response