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 SM ISO690:2012SYRBU, Nicolae, URSACHI, Veaceslav, NYARI, Terezia, BLAZHE, M., PRUNIC, P., TEZLEVAN, Victor. Spatial dispersion effects in the exciton-polariton reflectivity spectra of CuGaS2 crystals. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 23, 10-14 octombrie 2000, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 2000, Vol. 1, pp. 101-104. DOI: https://doi.org/10.1109/SMICND.2000.890196 |
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 Proceedings of the International Semiconductor Conference Vol. 1, 2000 |
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Conferința "International Semiconductor Conference" 23, Sinaia, Romania, 10-14 octombrie 2000 | ||||||
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| DOI:https://doi.org/10.1109/SMICND.2000.890196 | ||||||
| Pag. 101-104 | ||||||
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The analysis of the exciton reflectivity contour in CuGaS2 crystals at 8 K was carried out. Absorption and luminescence spectroscopy was employed for additional characterization. The value of the exciton Ridberg constant ℜ = 0.03247eV, the energy of the continuum Eg/n=∞ = 2.50305 eV and the thickness of the exciton-free layer L = 22 Å were deduced from this analysis. The excited n = 2 (2.53323 eV) and n = 3 (2.53774 eV) states of the excitons were determined. The upper polariton branch was drawn from the angular dependence of the reflectivity. |
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| Cuvinte-cheie Absorption spectroscopy, Continuum mechanics, Electron energy levels, Energy gap, Excitons, Luminescence, reflection, Semiconducting gallium compounds, Spectrum analysis |
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