Kinetics of image formation in the equipotential semiconductor- thermoplastic system
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ANIKIN, Valerii I., ZHURMINSKY, Igor. Kinetics of image formation in the equipotential semiconductor- thermoplastic system. In: Journal of Applied Physics, 2005, vol. 97, pp. 1-6. ISSN 0021-8979. DOI: https://doi.org/10.1063/1.1829146
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Journal of Applied Physics
Volumul 97 / 2005 / ISSN 0021-8979 /ISSNe 1089-7550

Kinetics of image formation in the equipotential semiconductor- thermoplastic system

DOI:https://doi.org/10.1063/1.1829146

Pag. 1-6

Anikin Valerii I., Zhurminsky Igor
 
Moldova State University
 
 
Disponibil în IBN: 2 noiembrie 2023


Rezumat

The redistribution of corona current in regions with a low potential has been experimentally shown. This led to the equipotentiality of the semiconductor-thermoplastic system at charging in the field of corona discharge. The self-coordinated model of kinetics formation of electrostatic contrast in a corona discharge is proposed. The model takes into consideration a nonlinearity of current-voltage characteristics of the semiconductor, and thermoplastic and deformation of the thermoplastic layer. The moment of deformation appearance is set at random from experimental data. © 2005 American Institute of Physics.

Cuvinte-cheie
Engineering controlled terms Current voltage characteristics, deformation, Electric corona, Electrostatics, Holographic interferometry, Image quality, photosensitivity, Semiconductor materials, Thermoplastics, Viscoelasticity Engineering uncontrolled terms Electrostatic contrast, Photothermoplastic medium (PTPM), Semiconductor-thermoplastic systems Engineering main heading Multilayers

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<title xml:lang='en'>Kinetics of image formation in the equipotential semiconductor- thermoplastic system</title>
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<publicationYear>2005</publicationYear>
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<subject>Engineering controlled terms
Current voltage characteristics</subject>
<subject>deformation</subject>
<subject>Electric corona</subject>
<subject>Electrostatics</subject>
<subject>Holographic interferometry</subject>
<subject>Image quality</subject>
<subject>photosensitivity</subject>
<subject>Semiconductor materials</subject>
<subject>Thermoplastics</subject>
<subject>Viscoelasticity
Engineering uncontrolled terms
Electrostatic contrast</subject>
<subject>Photothermoplastic medium (PTPM)</subject>
<subject>Semiconductor-thermoplastic systems
Engineering main heading
Multilayers</subject>
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