Properties of semiconductor scintillators and combined detectors of ionizing radiation based on ZnSe(Te,O)/pZnTe-nCdSe structures
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FOCSHA, Alexandru, GASHIN, Peter A., RYZHIKOV, V., STARZHINSKIY, Nikolai, GALCHINETSKII, Leonid, SILIN, Vitaliy. Properties of semiconductor scintillators and combined detectors of ionizing radiation based on ZnSe(Te,O)/pZnTe-nCdSe structures. In: Optical Materials, 2002, vol. 19, pp. 213-217. ISSN 0925-3467. DOI: https://doi.org/10.1016/S0925-3467(01)00221-X
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Optical Materials
Volumul 19 / 2002 / ISSN 0925-3467

Properties of semiconductor scintillators and combined detectors of ionizing radiation based on ZnSe(Te,O)/pZnTe-nCdSe structures

DOI:https://doi.org/10.1016/S0925-3467(01)00221-X

Pag. 213-217

Focsha Alexandru1, Gashin Peter A.1, Ryzhikov V.2, Starzhinskiy Nikolai2, Galchinetskii Leonid2, Silin Vitaliy2
 
1 Moldova State University,
2 Institute for Single Crystals of NAS of Ukraine
 
 
Disponibil în IBN: 29 august 2023


Rezumat

Methods for the practical utilization of the unique property combination found in crystals ZnSe(Te,O) as semiconductor materials and highly efficient scintillators have been studied. Scintillators based on isovalently doped ZnSe crystals have luminescence maximum λmax=600-640 nm, X-ray conversion efficiency 4-7% higher, and radiation stability - more than 103-104 times higher than CsI(Tl). It is shown that this combination allows the creation of AIIBVI heterostructures-photoreceivers of intrinsic luminescence of the scintillator directly on the ZnSe(Te,O) crystal surface. Methods are considered for the preparation of semiconductor scintillator and X-ray sensitive structure ZnSe(Te,O)/pZnTe-nCdSe. It has been shown that the maximum e.m.f. value for integrated detectors is 1.2-1.4 V, and their X-ray sensitivity reaches values up to 180-220 nA min/R cm2. The dynamic linearity range of the output characteristic of the detectors was not less than 105, the afterglow level after 20 ms - less than 0.05%, allowing them to be used in X-ray tomographs. 

Cuvinte-cheie
Doping (additives), Heterojunctions, ionizing radiation, Luminescence, Optical materials, Radiation detectors, Semiconducting zinc compounds, X ray analysis