Conţinutul numărului revistei |
Articolul precedent |
Articolul urmator |
352 3 |
Ultima descărcare din IBN: 2023-01-18 14:57 |
SM ISO690:2012 БЕРСИРОВА, Оксана, БРУК, Л., ДИКУСАР, Александр, КАРАМАН, М., СИДЕЛЬНИКОВА, Светлана, СИМАШКЕВИЧ, Алексей, ШЕРБАН, Д., ЯПОНЦЕВА, Ю. Тонкие пленки оксидов титана и олова и полупроводниковые структуры на их основе, полученные пиролитической пульверизацией: изготовление, характеризация и коррозионные свойства. In: Электронная обработка материалов, 2007, nr. 6(43), pp. 40-49. ISSN 0013-5739. |
EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
Электронная обработка материалов | ||||||
Numărul 6(43) / 2007 / ISSN 0013-5739 /ISSNe 2345-1718 | ||||||
|
||||||
Pag. 40-49 | ||||||
|
||||||
Descarcă PDF | ||||||
Rezumat | ||||||
The peculiarities of obtaining of tin and titanium oxide layers and semiconductor structures on their basis are described. The Roentgen diffraction results show that SnO2 and TiO2 layers possess crystalline tetragonal structure (anatas modification for TiO2).The results of element composition analysis and impedance investigations of the fabricated structures in the model chloride-sulfate solutions demonstrate that oxide/ SiO2/Si structures are obtained when Si substrates are used. In the case of InP substrates the oxide layer at the interface is not detected and the respective structure is oxide/InP. The results of corrosive investigations show that essential displacement of the corrosive potential to the anode region is observed in the case of deposition of SnO2 and TiO2 oxide layers on Si and InP crystals and fabrication of respective semiconductor structures. This fact demonstrates the availability of the utilization of these materials in photoelectrochemical applications. |
||||||
|