| Articolul precedent |
| Articolul urmator |
 |
 337 2 |
| Ultima descărcare din IBN: 2024-01-21 21:18 |
 SM ISO690:2012GRABCO, Daria, ŞIKIMAKA, Olga, HAREA, Evghenii, PYRTSAC, Constantin. CPPP 17 P Visualitation of undulatory mass transfer in near-surface vicinity of indentation contact zone. In: Materials Science and Condensed Matter Physics, 13-17 septembrie 2010, Chișinău. Chișinău, Republica Moldova: Institutul de Fizică Aplicată, 2010, Editia 5, p. 144. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| Materials Science and Condensed Matter Physics Editia 5, 2010 |
||||||
|
Conferința "Materials Science and Condensed Matter Physics" Chișinău, Moldova, 13-17 septembrie 2010 | ||||||
|
||||||
| Pag. 144-144 | ||||||
|
||||||
 Descarcă PDF |
||||||
| Rezumat | ||||||
Deformation regularities of crystals, films and coated systems assume ever greater importance in recent years. Particularly, it concerns the micro- and nanoindentation processes because of their large practical application. T h e microstructure of deformed zones under quasistatic nano-microindentation of some of coated systems (Cu/LiF, Cu/MgO, ITO/Si, SnO2/Si) was considered in the work to study the deformation specificity of coated systems as a whole, comparing their behaviour with this of the bulk crystals (LiF, MgO, Si) used as substrate. It was revealed plastic round pile-ups of material near indentations on both the bulk single crystals and coated systems (Fig. 1-3).FigureFig.1. Si. Computer rendering of AFM image of the surface relief near indentation. P=0.2 N.Fig.2. SnO2/Si. Light microscopy image of the pile-up zone near indentation. P=0.4 NFig.3. Cu/MgO. Light microscopy image of the pile-up zone near indentation. P=0.4 N |
||||||
|
|
|
|
