<?xml version='1.0' encoding='utf-8'?>
<oai_dc:dc xmlns:dc='http://purl.org/dc/elements/1.1/' xmlns:oai_dc='http://www.openarchives.org/OAI/2.0/oai_dc/' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd'>
<dc:creator>Grabco, D.Z.</dc:creator>
<dc:creator>Şikimaka, O.A.</dc:creator>
<dc:creator>Harea, E.E.</dc:creator>
<dc:creator>Pîrţac, C.M.</dc:creator>
<dc:date>2010</dc:date>
<dc:description xml:lang='en'><p>Deformation regularities of crystals, films and coated systems assume ever greater importance in recent years. Particularly, it concerns the micro- and nanoindentation processes because of their large practical application. T h e microstructure of deformed zones under quasistatic nano-microindentation of some of coated systems (Cu/LiF, Cu/MgO, ITO/Si, SnO2/Si) was considered in the work to study the deformation specificity of coated systems as a whole, comparing their behaviour with this of the bulk crystals (LiF, MgO, Si) used as substrate. It was revealed plastic round pile-ups of material near indentations on both the bulk single crystals and coated systems (Fig. 1-3).</p><p>Figure</p><p>Fig.1. Si. Computer rendering of AFM image of the surface relief near indentation. P=0.2 N.</p><p>Fig.2. SnO2/Si. Light microscopy image of the pile-up zone near indentation. P=0.4 N</p><p>Fig.3. Cu/MgO. Light microscopy image of the pile-up zone near indentation. P=0.4 N</p></dc:description>
<dc:source>Materials Science and Condensed Matter Physics (Editia 5) 144-144</dc:source>
<dc:title>CPPP 17 P Visualitation of undulatory mass transfer in near-surface vicinity of indentation contact zone</dc:title>
<dc:type>info:eu-repo/semantics/article</dc:type>
</oai_dc:dc>