Afiliat la Рязанский государственный радиотехнический университет
The ionization energy determination of deep level defects in inhomogeneous doped semiconductor barrier structures |
Gudzev Valerii , Zubkov M. , Litvinov V. , Maslov A. |
Telecommunications, Electronics and Informatics |
Ed. 5. 2015. Chișinău, Republica Moldova. . 176-178. |
Disponibil online 21 May, 2018 |
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