ZnS_XSe_1-X (x = 0, 0.2, 0.4, 0.5, 0.6, 0.8 and 1.0) thin films were deposited onto glass substrates using thermal evaporation under vacuum technique, in a quasi-closed volume. By X-ray diffraction technique it was revealed that the obtained films are polycrystalline, having a cubic blende structure. The cubic lattice parameter, a, ranged from 5.658 nm (for x = 0) and 5.406 nm (for x = 1). The crystallite sizes decrease with increase of x from D = 20.0 nm to D = 13.4 nm. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) reveal a columnar grain shape and a low roughness of the surface. The chemical composition of the ZnS_XSe_1-X obtained films were confirmed by energy-dispersive X-ray spectroscopy (EDX). The vibrational properties of the ZnS_xSe_1-x thin films are studied using Raman scattering measurements.