Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals
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LEVCENKO, Sergiu, HAJDEU-CHICAROS, Elena, GARCIA-LLAMAS, E., CABALLERO, Raquel, SERNA, Rosalia, BODNAR, Ivan V., VICTOROV, Ivan, GUK, Maxim, MERINO, Jose Manuel, PEREZ-RODRIGUEZ, Alejandro, ARUSHANOV, Ernest, LEON, Maximo. Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals. In: Applied Physics Letters, 2018, vol. 112, p. 0. ISSN 0003-6951. DOI: https://doi.org/10.1063/1.5024683
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Applied Physics Letters
Volumul 112 / 2018 / ISSN 0003-6951

Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals

DOI:https://doi.org/10.1063/1.5024683

Pag. 0-0

Levcenko Sergiu1, Hajdeu-Chicaros Elena2, Garcia-Llamas E.3, Caballero Raquel3, Serna Rosalia4, Bodnar Ivan V.5, Victorov Ivan5, Guk Maxim2, Merino Jose Manuel3, Perez-Rodriguez Alejandro67, Arushanov Ernest2, Leon Maximo3
 
1 Helmholtz-Centre Berlin for Materials and Energy,
2 Institute of Applied Physics, Academy of Sciences of Moldova,
3 Universidad Autónoma de Madrid,
4 Necunoscută, Spania,
5 Belarusian State University,
6 Catalonia Institute for Energy Research (IREC), Barcelona,
7 University of Barcelona
 
 
Disponibil în IBN: 6 mai 2018


Rezumat

The linear optical properties of Cu2ZnSnS4 bulk poly-crystals have been investigated using spectroscopic ellipsometry in the range of 1.2-4.6 eV at room temperature. The characteristic features identified in the optical spectra are explained by using the Adachi analytical model for the interband transitions at the corresponding critical points in the Brillouin zone. The experimental data have been modeled over the entire spectral range taking into account the lowest E0 transition near the fundamental absorption edge and E1A and E1B higher energy interband transitions. In addition, the spectral dependences of the refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity values have been accurately determined and are provided since they are essential data for the design of Cu2ZnSnS4 based optoelectronic devices.

Cuvinte-cheie
Copper compounds, Optoelectronic devices, refractive index, Spectroscopic ellipsometry, Tin compounds, Zinc compounds