A method for calculation of dielectric constants of ultrathin superlattices
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MIROVITSKII, Vadim. A method for calculation of dielectric constants of ultrathin superlattices. In: Journal of Physics Condensed Matter, 1997, vol. 9, pp. 4575-4581. ISSN 0953-8984. DOI: https://doi.org/10.1088/0953-8984/9/22/009
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Journal of Physics Condensed Matter
Volumul 9 / 1997 / ISSN 0953-8984 /ISSNe 1361-648X

A method for calculation of dielectric constants of ultrathin superlattices

DOI:https://doi.org/10.1088/0953-8984/9/22/009

Pag. 4575-4581

Mirovitskii Vadim
 
Institute of Power Engineering of ASM
 
 
Disponibil în IBN: 1 martie 2024


Rezumat

An approach to the calculation of static dielectric constants of the (AC)n(BC)n ultrathin superlattices (SL) composed of III-V or II-VI semiconductors is presented. These SL are formally considered to result from artificial ordering of alternative A (B) atoms in the initial crystalline structure (ICS) - the bulk solid solution AxB1-xC with x = m/(m + n). According to this viewpoint, the SL dielectric constants are expressed in terms of the ICS, and variations depending on the superperiod and degree of ordering. The changes in dielectric constants are calculated on the basis of phenomenological Landau theory of second-order phase transitions, which takes into account thermodynamic instability of the SL. We consider [001]-oriented SL with m + n = 3.

Cuvinte-cheie
Engineering controlled terms Atoms, boundary conditions, Calculations, composition, crystal structure, Maxwell equations, Permittivity, Phase transitions, Solid solutions, Thermodynamic stability Engineering uncontrolled terms Artificial ordering, Initial crystalline structure, Landau theory Engineering main heading Semiconductor superlattices