Charge carrier distribution in free-standing porous GaP membranes studied by Raman spectroscopy
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SARUA, Andrei, TIGINYANU, Ion, URSACHI, Veaceslav, IRMER, Gert, MONECKE, Jochen, HARTNAGEL, Hans Ludwig. Charge carrier distribution in free-standing porous GaP membranes studied by Raman spectroscopy. In: Solid State Communications, 1999, vol. 112, pp. 581-585. ISSN 0038-1098. DOI: https://doi.org/10.1016/S0038-1098(99)00385-3
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Solid State Communications
Volumul 112 / 1999 / ISSN 0038-1098 /ISSNe 1879-2766

Charge carrier distribution in free-standing porous GaP membranes studied by Raman spectroscopy

DOI:https://doi.org/10.1016/S0038-1098(99)00385-3

Pag. 581-585

Sarua Andrei12, Tiginyanu Ion1, Ursachi Veaceslav1, Irmer Gert2, Monecke Jochen2, Hartnagel Hans Ludwig3
 
1 Institute of Applied Physics, Academy of Sciences of Moldova,
2 Technical University Bergakademie Freiberg,
3 Technical University Darmstadt
 
 
Disponibil în IBN: 10 noiembrie 2023


Rezumat

Free-standing porous GaP membranes were fabricated by anodic etching of (111)-oriented crystalline substrates in H2SO4 aqueous solution. The formation of a column-shaped porous structure with average structure dimension of 50 nm was proved by SEM-investigations. Raman measurements on both as-grown bulk and porous GaP were performed. Porous membranes were measured under different filling condition of the pores either with air or with a methanol-ethanol mixture. The theoretically predicted downward shift of the surface-related mode situated between the LO- and TO-modes in spectra from porous membranes related to the environment change was detected. The spectra of porous membranes can be interpreted as a superposition of those of depleted surface layers and of GaP-skeleton containing free carriers. This interpretation is based on both a Schottky-model approach and a numerical solution of the Poisson-equation.

Cuvinte-cheie
charge carriers, Crystal orientation, Crystalline materials, etching, light scattering, mixtures, porous materials, Raman spectroscopy, scanning electron microscopy, Semiconductor growth, Solutions, Substrates