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<identifier identifierType='DOI'>10.1063/1.4828885</identifier>
<creators>
<creator>
<creatorName>Guc, M.S.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Levcenco, S.V.</creatorName>
<affiliation>Helmholtz-Centre Berlin for Materials and Energy, Germania</affiliation>
</creator>
<creator>
<creatorName>Izquierdo-Roca, V.</creatorName>
<affiliation>Catalonia Institute for Energy Research (IREC), Barcelona, Spania</affiliation>
</creator>
<creator>
<creatorName>Fontane, X.</creatorName>
<affiliation>Catalonia Institute for Energy Research (IREC), Barcelona, Spania</affiliation>
</creator>
<creator>
<creatorName>Valakh, M.Y.</creatorName>
<affiliation>Institutul de Fizică a Semiconductorilor al Academiei Naţionale de Ştiinţe a Ucrainei, Ucraina</affiliation>
</creator>
<creator>
<creatorName>Aruşanov, E.C.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Perez-Rodriguez, A.</creatorName>
<affiliation>Catalonia Institute for Energy Research (IREC), Barcelona, Spania</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='en'>Polarized Raman scattering analysis of Cu2ZnSiS4 and Cu2ZnSiSe4 single crystals</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2013</publicationYear>
<relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>0021-8979</relatedIdentifier>
<subjects>
<subject>Engineering controlled terms
Single crystals
Engineering uncontrolled terms
High-resolution spectra</subject>
<subject>Inplane rotation</subject>
<subject>Numerical values</subject>
<subject>Polarized Raman</subject>
<subject>Polarized Raman spectra</subject>
<subject>Scattering analysis</subject>
<subject>Spectral region</subject>
<subject>Symmetry assignment
Engineering main heading
Raman scattering</subject>
</subjects>
<dates>
<date dateType='Issued'>2013-11-07</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'><p>The polarized Raman spectra of the Cu<sub>2</sub>ZnSiS<sub>4</sub>&nbsp;and Cu<sub>2</sub>ZnSiSe<sub>4</sub>&nbsp;single crystals were investigated as a function of the in-plane rotation angle on the basal (210) crystal planes. The position of up to 32 (for the sulphide compound) and 27 (for the selenide compound) Raman peaks was determined for each of the compounds in the spectral region 50-600 cm<sup>-1</sup>. A careful analysis of the high resolution spectra that were measured under different polarization configurations has allowed determining the A<sub>1</sub>(TO), A<sub>2</sub>, and B<sub>1</sub>/B<sub>2</sub>(TO + LO) symmetry of the dominant and some weaker Raman modes. The investigation of the dependence of the intensity of the peaks with the rotation angle has corroborated the symmetry assignment of the main modes and has allowed to estimate numerical values of Raman tensor elements for these compounds. The importance of anharmonic one-two phonons interaction in the Raman spectra of the investigated crystals is discussed.&nbsp;</p></description>
</descriptions>
<formats>
<format>application/pdf</format>
</formats>
</resource>