Doping of interfaces in (La0.7Sr0.3MnO 3)1-x:(MgO)x composite films
Закрыть
Conţinutul numărului revistei
Articolul precedent
Articolul urmator
216 0
SM ISO690:2012
KOSTER, Soren A., MOSHNYAGA, Vasily T., SAMWER, Konrad H., LEBEDEV, Oleg, VANTENDELOO, G, SHAPOVAL, Oleg M., BELENCHUK, Alexandr. Doping of interfaces in (La0.7Sr0.3MnO 3)1-x:(MgO)x composite films. In: Applied Physics Letters, 2002, vol. 81, pp. 1648-1650. ISSN 0003-6951. DOI: https://doi.org/10.1063/1.1503849
EXPORT metadate:
Google Scholar
Crossref
CERIF

DataCite
Dublin Core
Applied Physics Letters
Volumul 81 / 2002 / ISSN 0003-6951 /ISSNe 1077-3118

Doping of interfaces in (La0.7Sr0.3MnO 3)1-x:(MgO)x composite films

DOI:https://doi.org/10.1063/1.1503849

Pag. 1648-1650

Koster Soren A.1, Moshnyaga Vasily T.1, Samwer Konrad H.1, Lebedev Oleg2, VanTendeloo G2, Shapoval Oleg M.3, Belenchuk Alexandr3
 
1 Physikalisches Institut,Georg-August-Universität Göttingen,
2 University of Antwerp,
3 Institute of Applied Physics, Academy of Sciences of Moldova
 
 
Disponibil în IBN: 16 iunie 2023


Rezumat

Composite thin films of (La0.7Sr0.3MnO 3)1-x:(MgO)x (x=0-0.5) were grown on Al 2O3 (0001) substrates by a metalorganic aerosol deposition technique. A columnar growth of the films with the predominance of (111)- and (1̄10)-orientation was observed. Pure films (x=0) show a Curie temperature of TC=362K, a metallic behavior accompanied with a low residual resistivity ρ∼10-4cm at T=4.2K and a very small low-field magnetoresistance. Low amounts of MgO doping, x=0.05, result in a totally different electrical transport behavior which is a pronounced low-field magnetoresistance MR=25% at T=4.2K. The MgO was found to be located at the interfaces between the grains thus building tunneling barriers and enhancing spin polarized tunneling similar to a system with vertical artificial tunnel junctions. 

Cuvinte-cheie
deposition, Electric resistance, Magnetoelectronics, Magnetoresistance, manganese oxide, Semiconductor doping, Tunnel junctions