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![]() ENAKI, Nicolae, BAZGAN, Sergiu, MIHĂILESCU, Ion. Measurements of amplitude and frequencies of subwavelength oscillations of atoms using resonance fluorescence of three levels atom in two standing waves. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 7, 21-24 august 2014, Constanța. Bellingham, Washington: SPIE, 2015, Ediţia 7, Vol.9258, p. 0. ISBN 978-162841325-0. ISSN 0277786X. DOI: https://doi.org/10.1117/12.2070332 |
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Proceedings of SPIE - The International Society for Optical Engineering Ediţia 7, Vol.9258, 2015 |
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Conferința "Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies" 7, Constanța, Romania, 21-24 august 2014 | ||||||
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DOI:https://doi.org/10.1117/12.2070332 | ||||||
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The resonance fluorescence of an atomic (or ion) system implanted in the materials driving two standing waves of the optical cavity is studied taking into consideration the delocalization of the atom. It is demonstrated that the resonance fluorescence depends on the position of atoms (or ions) relative the nodes or antinodes of standing waves. This situation gives us the possibility to measure the amplitude of mechanical oscillations of these radiators implanted in organic or inorganic materials. It is proposed to measure the amplitude of the mechanical oscillations relative to the equilibrium position using the time changes in the positions of the five peaks of the resonance fluorescence spectrum. In this case, the small oscillation amplitude relative to the standing wave length can drastically change the spectrum of resonance fluorescence of such atoms. The proposed method can be used in the measurements of the nanostructure temperature (or bio-molecule temperature deformation). |
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Cuvinte-cheie Elastic waves, Fluorescence, microelectronics, nanotechnology, Optoelectronic devices, resonance |
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