| Articolul precedent |
| Articolul urmator |
 |
 180 0 |
 SM ISO690:2012BIKORIMANA, Simeon, LAMA, Pemba T., WALSER, Ardie D., DORSINVILLE, Roger, ANGHEL, Sergiu, MITIOGLU, Anatolie, MICU, A., KULYUK, Leonid. Z-scan characterization of two-dimensional transition metal dichalcogenide few-layer sheets. In: Conference on Lasers and Electro-Optics: CLEO 2016, 5-10 iunie 2016, San Jose. San Jose, USA: Institute of Electrical and Electronics Engineers Inc., 2016, p. 0. ISBN 978-194358011-8. DOI: https://doi.org/10.1364/cleo_at.2016.jth2a.71 |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| Conference on Lasers and Electro-Optics 2016 | ||||||
|
Conferința "Conference on Lasers and Electro-Optics" San Jose, Statele Unite ale Americii, 5-10 iunie 2016 | ||||||
|
||||||
| DOI:https://doi.org/10.1364/cleo_at.2016.jth2a.71 | ||||||
| Pag. 0-0 | ||||||
|
||||||
| Vezi articolul | ||||||
| Rezumat | ||||||
The Z-scan technique was applied to investigate the nonlinear absorption and refraction in few layer sheets of 2D transition metal dichalcogenide: WS2, MoS2, WSe2 and Mo0.5W0.5S2, which showed nonlinear saturable absorption and two photon absorption. |
||||||
| Cuvinte-cheie Computerized tomography, layered semiconductors, Molybdenum compounds, Selenium compounds, Sulfur compounds, transition metals, Two photon processes |
||||||
|
|
|
|
