Conţinutul numărului revistei |
Articolul precedent |
Articolul urmator |
273 0 |
SM ISO690:2012 ABASHKIN, Vladimir, AKIMOVA, Elena, MESHALKIN, Alexei, PRISAKAR, Alexandr, TRIDUKH, Ghennadi, VLCEK, Miroslav, LOGHINA (BEŢ), Liudmila, VOYNAROVYCH, Ivan. Investigation of structural features of As2S3–Se multilayer nanostructure by Raman spectroscopy. In: Surface Engineering and Applied Electrochemistry, 2016, nr. 4(52), pp. 380-386. ISSN 1068-3755. DOI: https://doi.org/10.3103/S1068375516040025 |
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Surface Engineering and Applied Electrochemistry | ||||||
Numărul 4(52) / 2016 / ISSN 1068-3755 /ISSNe 1934-8002 | ||||||
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DOI:https://doi.org/10.3103/S1068375516040025 | ||||||
Pag. 380-386 | ||||||
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The focus of this research is on the investigation of structural changes in the As2S3–Se multilayer nanostructure and on the examination of a relative contribution of As2S3 and Se layers to nanostructuring by measuring the Raman spectra. The formation of the As2S3-Se nanostructure by an alternate As2S3 and Se layers deposition was applied. The diffraction efficiency dependence on the exposure of a CW DPSS laser were monitored in a transmission mode of the1st order diffracted beam intensity and measured in real-time at the normal incidence of the laser diode beam (λ = 650 nm). From the comparison of these dependences for a set of samples we have chosen the multilayer nanostructure As2S3–Se with optimal recording properties meaning maximum both the value and the rate of diffraction efficiency. Our results are found to be of practical interest as they allow a significant improvement of the diffraction efficiency of the directly recorded relief gratings. |
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Cuvinte-cheie chalcogenide glasses, nanostructures, Raman spectroscopy, surface grating |
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