Afișare rezultate

SM ISO690:2012

Effect of substrate origin on stability of electrical conductivity of SnO2 thin polycrystalline films

Ivashchenko Anatolii, Cherner Iacov, Maronchuk Irina

Institute of Applied Physics, Academy of Sciences of Moldova

Proceedings of the International Semiconductor Conference

Vol. 1. 2000. New Jersey. DOI 10.1109/SMICND.2000.

Disponibil online 29 November, 2023. Descarcări-0. Vizualizări-163

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Spin-lattice instability in the chromium sulfur spinel Fe 0.5Cu0.5Cr2S4

Kalvius Georg Michael1, Hartmann Olaf N.2, Krimmel Alexander3, Wagner Friedrich Ernst1, Wappling Roger W.2, Ţurcan Vladimir34, Krug Von Nidda Hans Albrecht3, Loidl Alois3

3 Center for Electronic Correlations and Magnetism, University of Augsburg, 4 Institute of Applied Physics, Academy of Sciences of Moldova

Journal of Physics Condensed Matter

Nr. / 2008 / ISSN 0953-8984 /ISSNe 1361-648X

Disponibil online 6 March, 2024. Descarcări-0. Vizualizări-155

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Solid state gas sensors: Some aspects of electrical conductivity and reconstruction of intergrain barriers in the gas sensitive films

Ivashchenko Anatolii, Kemer Iacov, Kemer Iacov

Academy of Sciences of Moldova

Proceedings of the International Semiconductor Conference

Vol. 1. 1998. New Jersey. DOI 10.1109/SMICND.1998.732248.

Disponibil online 5 December, 2023. Descarcări-0. Vizualizări-145

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Effect of substrate origin and annealing conditions on stability of electrical conductivity of SnO2 thin polycrystalline films

Ivashchenko Anatolii, Cherner Iacov, Maronchuk Irina

Institute of Applied Physics, Academy of Sciences of Moldova

Proceedings of the International Semiconductor Conference

Vol. 2. 2001. New Jersey. .

Disponibil online 29 November, 2023. Descarcări-0. Vizualizări-126

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Polysilicon thin layers for photovoltaic applications

Budianu Elena1, Purica Munizer1, Rusu Emil2, Manea Elena1, Gavrila Raluca1

1 National Institute for Research and Development in Microtechnologies , 2 Institute of Applied Physics, Academy of Sciences of Moldova

Proceedings of the International Semiconductor Conference

Vol. 1, Ediția 25. 2002. New Jersey. ISBN 0780374401.

Disponibil online 29 November, 2023. Descarcări-0. Vizualizări-194

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Structural characterization of SnO2 gas sensing films deposited by spray pyrolysis

Korotcenkov Ghenadie1, DiBattista Michael1, Schwank Johannes W.1, Brînzari Vladimir2

2 Technical University of Moldova

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Nr. / 2000 / ISSN 0921-5107

Disponibil online 20 June, 2023. Descarcări-0. Vizualizări-192

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Heterojunction with ZnO polycrystalline thin films for optoelectronic devices applications

Purica Munizer1, Budianu Elena1, Rusu Emil2

1 National Institute for Research and Development in Microtechnology, IMT-Bucharest, 2 Institute of Applied Physics, Academy of Sciences of Moldova

Microelectronic Engineering

Nr. / 2000 / ISSN - /ISSNe 0167-9317

Disponibil online 30 June, 2023. Descarcări-0. Vizualizări-161

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Percolation theory approach to the description of electrical conductivity near 3D-2D transition in thin polycrystalline SnO2 films

Ivashchenko Anatolii, Cherner Iacov, Maronchuk Irina

Academy of Sciences of Moldova

Proceedings of the International Semiconductor Conference

Vol. 1. 1996. New Jersey. DOI 10.1109/SMICND.1996.

Disponibil online 7 December, 2023. Descarcări-0. Vizualizări-119

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Structural and dimensional effects in electrical conductivity of SnO2 thin films used for gas sensors

Ivashchenko Anatolii, Cherner Iacov

Academy of Sciences of Moldova

Proceedings of the International Semiconductor Conference

Vol. 2. 1999. New Jersey. DOI 10.1109/SMICND.1999.

Disponibil online 29 November, 2023. Descarcări-0. Vizualizări-129

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