Afiliat la Institutul de Fizică Aplicată al AŞM
| Analytical test of the film/substrate boundary perfection in SnO 2 thin films |
| Ivashchenko Anatolii , Cherner Iacov |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 2, Ediția 27. 2004. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 433-436. |
| Disponibil online 27 November, 2023 |
| Effect of substrate origin and annealing conditions on stability of electrical conductivity of SnO2 thin polycrystalline films |
| Ivashchenko Anatolii , Cherner Iacov , Maronchuk Irina |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 2. 2001. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 391-394. |
| Disponibil online 29 November, 2023 |
| Effect of substrate origin on stability of electrical conductivity of SnO2 thin polycrystalline films |
| Ivashchenko Anatolii , Cherner Iacov , Maronchuk Irina |
| Proceedings of the International Semiconductor Conference CAS |
| Vol. 1. 2000. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 139-142. |
| Disponibil online 29 November, 2023 |
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