| Conţinutul numărului revistei |
| Articolul precedent |
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 197 0 |
 SM ISO690:2012KRAVETSKY, Igor, KULYUK, Leonid, LUPU, Anatol, SHUTOV, D., SURUCEANU, Grigore, SYRBU, Alexei, YACOVLEV, Vladimir. Internal second-harmonic generation in CW AlGaAs SQW lasers: the facet degradation monitoring. In: Applied Surface Science, 1993, vol. 69, pp. 424-428. ISSN 0169-4332. DOI: https://doi.org/10.1016/0169-4332(93)90546-N |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
 Applied Surface Science |
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| Volumul 69 / 1993 / ISSN 0169-4332 | ||||||
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| DOI:https://doi.org/10.1016/0169-4332(93)90546-N | ||||||
| Pag. 424-428 | ||||||
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| Rezumat | ||||||
The spectra of the second-harmonic (SH) radiation, generated in the separate-confinement single quantum well (SQW) semiconductor AlGaAs/GaAs laser have been measured at various levels of the injection current. The observed correlation between laser and SH mode intensities is explained by taking into consideration the dispersion of the second-order nonlinear susceptibility of the GaAs active region. It is shown, that due to the high sensitivity of the SH signal to the semiconductor near-surface layer condition, the internal SH generation can be used for the in situ diagnostics of the laser facet degradation processes. |
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| Cuvinte-cheie Engineering controlled terms Degradation, monitoring, Optical variables measurement, Second harmonic generation, Semiconductor quantum wells Engineering uncontrolled terms Facet degradation monitoring, In situ diagnostics Engineering main heading Semiconductor lasers |
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