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 SM ISO690:2012BAKERENKOV, A., PERSHENKOV, Vyacheslav, RODIN, A., FELITSYN, V., MIROSHNICHENKO, A.. Numerical estimation of the radiation hardness of bipolar integrated circuits in various irradiation conditions of space environment. In: Nanotechnologies and Biomedical Engineering, Ed. 3, 23-26 septembrie 2015, Chișinău. Springer, 2015, Editia 3, p. 125. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| Nanotechnologies and Biomedical Engineering Editia 3, 2015 |
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Conferința "International Conference on Nanotechnologies and Biomedical Engineering" 3, Chișinău, Moldova, 23-26 septembrie 2015 | ||||||
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| Pag. 125-125 | ||||||
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The conversion model of low dose rate effect in bipolar devices was used for numerical simulation of total dose effects in bipolar devices for various radiation conditions of space environment. The numerical simulation was performed for cyclic temperature irradiation, which is typical for space applications, and for solar flare impact. |
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