Detection in the contacts at low temperatures _influence of the free electrons concentration on the detecting parameters
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2020-12-08 11:06
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KERNER, Iacov. Detection in the contacts at low temperatures _influence of the free electrons concentration on the detecting parameters . In: Microelectronics and Computer Science, Ed. 9, 19-21 octombrie 2017, Chisinau. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2017, Ediția 9, p. 517. ISBN 978-9975-4264-8-0.
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Microelectronics and Computer Science
Ediția 9, 2017
Conferința "Microelectronics and Computer Science"
9, Chisinau, Moldova, 19-21 octombrie 2017

Detection in the contacts at low temperatures _influence of the free electrons concentration on the detecting parameters


Pag. 517-517

Kerner Iacov
 
Institute of the Electronic Engineering and Nanotechnologies "D. Ghitu" of the Academy of Sciences of Moldova
 
 
Disponibil în IBN: 2 noiembrie 2017


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