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 SM ISO690:2012IVASHCHENKO, Anatolii, KERNER, Iacov. Structural effects in electrical conductivity of SnO2 thin films. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 20, 7-11 octombrie 1997, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 1997, Vol. 2, pp. 451-454. DOI: https://doi.org/10.1109/SMICND.1997.651244 |
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| Proceedings of the International Semiconductor Conference Vol. 2, 1997 |
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Conferința "International Semiconductor Conference" 20, Sinaia, Romania, 7-11 octombrie 1997 | ||||||
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| DOI:https://doi.org/10.1109/SMICND.1997.651244 | ||||||
| Pag. 451-454 | ||||||
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Electrical conductivity in SnO2 thin films is studied within the framework of percolation theory. To improve the agreement between experiment and theory the effect of film microstructure was taken into account by chose the uniform function for energy distribution of intergrain barrier heights. |
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| Cuvinte-cheie computer simulation, Crystal microstructure, Electric conductivity of solids, Percolation (solid state), Semiconducting films, thin films |
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