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 SM ISO690:2012IVASHCHENKO, Anatolii, KERNER, Iacov. Structural and dimensional effects in electrical conductivity of SnO2 thin films used for gas sensors. In: Proceedings of the International Semiconductor Conference: CAS, Ed. 22, 5-9 octombrie 1999, Sinaia. New Jersey: Institute of Electrical and Electronics Engineers Inc., 1999, Vol. 2, pp. 499-502. DOI: https://doi.org/10.1109/SMICND.1999.810594 |
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| Proceedings of the International Semiconductor Conference Vol. 2, 1999 |
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Conferința "International Semiconductor Conference" 22, Sinaia, Romania, 5-9 octombrie 1999 | ||||||
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| DOI:https://doi.org/10.1109/SMICND.1999.810594 | ||||||
| Pag. 499-502 | ||||||
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Electrical conductivity in SnO2 thin films near the three dimensional-two dimensional transition is investigated within the framework of percolation theory. Four methods are used to model film microstructure. The model of weakly textured polycrystal gives the best results. |
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| Cuvinte-cheie Chemical sensors, Crystal microstructure, Electric conductivity of solids, mathematical models, Percolation (solid state), Phase transitions, Polycrystalline materials, Semiconducting tin compounds, Textures, thin films |
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